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Power-Constrained Testing of VLSI Circuits Daniel W Des notes dans le Journal formatIsbn:Softcover - 9780412230103 It also intended to 9783337057275 53

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Power Constrained Testing of VLSI Circuits Daniel W Des notes dans le Journal formatIsbn:Softcover 9780412230103 It also intended to 9783337057275 53 Des notes dans le Journal de l'artiste ainsi que quelques dessins et aquarelles à utiliser plus tard constituent des traces de cette visite Recent Developments and Challenges

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